X-ray diffraction services (XRD) - High Resolution Diffraction, Siemens D5000, Phase Identification, Residual Stress Analysis, Particle Size, Quantitative Analysis, High Temperature Analysis, furnace, to 2500°C., Films Siemens D500, D5000, Epitaxial Films, Highly Perfect Crystals Blake, Industries Double Crystal, Diffractometer, Diamond Saw, Ball Mill, Screens

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Equipment

Siemens D5000 - Huber G670 - Philips PW1800 - Philips X-'pert - Spectrace QuanX - ISI SX-40A - SEM Coater System - Prep. Equip.

Siemens D5000 Diffractometer

Manufacturer: Bruker-AXS

The Siemens D5000 instrument has a large diameter goniometer (600 mm), low divergence collimator, and Soller slits.

Attachments include sample spinner stages, reflection/transmission holders, incident or diffracted beam monochromators, zero background holders, and odd sample shape holders. The instrument is useful for both powder and bulk materials.

This diffractometer is best utilized for high-precision work.

Data collection is performed under computer control using the MDI "DataScan" software application.