X-ray diffraction services (XRD) - High Resolution Diffraction, Siemens D5000, Phase Identification, Residual Stress Analysis, Particle Size, Quantitative Analysis, High Temperature Analysis, furnace, to 2500°C., Films Siemens D500, D5000, Epitaxial Films

$X-ray diffraction services, XRD, X-ray analytical services, x-ray diffraction analysis$

<- Please use our time-saving tools! ->

Equipment

Siemens D5000 - Huber G670 - Philips PW1800 - Philips X-'pert - Spectrace QuanX - ISI SX-40A - SEM Coater System - Prep. Equip.

Huber G670 Guinier Camera Diffractometer

More Info: Huber Diffraktionstechnik

Modeled after a photographic film diffraction pattern recording device, the Huber G670 instrument has an electronic CCD imaging plate (replacing the photographic film), scanning laser, image plate erasure lamp, and very fast data collection. Resolution is to 0.005 degree in the angular range of 4 to 100 degrees (Bragg angle).

This instrument works only in the transmission mode (X-rays penetrate through the thin sample layer, diffracting as they emerge on the far side of the sample layer).

Attachments include sample oscillator for large-particle transmission efficiency improvement, and a capillary sample holder.

This diffractometer is best utilized for high-precision and high-speed work on dry powders of all kinds.