X-ray diffraction services (XRD) - High Resolution Diffraction, Siemens D5000, Phase Identification, Residual Stress Analysis, Particle Size, Quantitative Analysis, High Temperature Analysis, furnace, to 2500°C., Films Siemens D500, D5000, Epitaxial Films

$X-ray diffraction services, XRD, X-ray analytical services, x-ray diffraction analysis$

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Equipment

Siemens D5000 - Huber G670 - Philips PW1800 - Philips X-'pert - Spectrace QuanX - ISI SX-40A - SEM Coater System - Prep. Equip.

ISI SX- 40A
Scanning Electron Microscope

The ISI SX-40A Scanning Electron Microscope is a moderate-capability instrument. The maximum potential is 30 KeV and it has a maximum attainable magnification of 100,000X.

Samples are mounted on "studs" and, if necessary, are coated with either carbon or gold in order to provide a conductive path to ground for the beam electrons that strike the sample surface. The stud is placed in the evacuated chamber (bottom of the tower assembly) on a remotely operated platform that has 5 degrees of freedom.

The original system included a high-persistence CRT screen for the operator to view the image and when that was satisfactorily set, a projection of the image was sent to a Polaroid camera for image capture. Evex Analytical has retro-fitted this instrument with a high-speed digital imaging system which greatly improves the image output and allows for software image enhancement to bring out details that were formerly lost in the camera’s film image.

In addition to the image acquisition subsystem, Evex Analytical has also integrated an EDS (energy-dispersive spectrometer) which is used to analyze chemistry over a small spot on the sample. A spectrum of Intensity vs. Energy (KeV) is output from this subsystem and, like the digital image, is easily imported into a written report.