High Resolution Diffraction Siemens D5000 Phase Identification Residual Stress Analysis
X-ray diffraction services, XRD, X-ray analytical services, x-ray diffraction analysis
X-ray diffraction services, XRD, X-ray analytical services, x-ray diffraction analysis
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Equipment
Siemens D5000   -   Huber G670    -   Philips PW1800   -   Philips X-'pert   -   Spectrace QuanX   -   ISI SX-40A   -   SEM Coater System   -   Prep. Equip.
Philips X-'pert Diffractometer More Info: Philips Analytical (PANalytical)  

The Philips X-'pert automatic powder diffractometry system has a high speed, high precision goniometer, high efficiency generator, and an automatic 35-sample loading facility. Pre-loading a magazine of sample trays allows the technician to complete a batch of samples without needing to be present when sample changing is required. Throughput is, thus, greatly increased.

The design of the goniometer is that of a fixed X-ray source which requires that the detector and the sample tilt simultaneously to render the theta-theta angular relationship between source and detector. The X-'pert system has a wide ranging step and continuous scan capability, with programmable step rotation.

Batch or single-sample data collection and raw data spectral display is performed under computer control by the Philips' "X-'pert Industry" application software.

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