High Resolution Diffraction Siemens D5000 Phase Identification Residual Stress Analysis
X-ray diffraction services, XRD, X-ray analytical services, x-ray diffraction analysis
X-ray diffraction services, XRD, X-ray analytical services, x-ray diffraction analysis
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Equipment
Siemens D5000   -   Huber G670    -   Philips PW1800   -   Philips X-'pert   -   Spectrace QuanX   -   ISI SX-40A   -   SEM Coater System   -   Prep. Equip.
Diamond Saw, Ball Mill and Screens

Sample preparation is available for a number of materials. Large solids can be cut into proper sized samples with a diamond saw, while powders can be pulverized with a ball mill to produce the desired size powders (typically <25 microns). In the case of powders, screens are also available for separating out larger grains which often cause misleading x-ray diffraction results.

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