Scanning Electron Microscopes

Two Scanning Electron Microscopes are available for sample analysis:

• Zeiss ΣIGMA - Modern instrument with outstanding imaging and analytical capabilities from a Field Emission SEM. Accelerating potential from 100V-30kV utilizing a ZrO-W Schottky FE source. Imaging capabilities with either secondary or backscattered electrons with resolution of 1.7nm at 15kV and 3.0nm at 1kV. Ideally suited for examination of non-conductive samples such as ceramics, glass, polymers etc. Instrument has capability of chemical analysis and mapping with an Energy Dispersive Spectroscopy detector driven by an Oxford INCA 150 microanalysis system.

• Topcon ABT-32 - A cost effective alternative to the FESEM for routine analysis. Samples can be coated with either C or Au to enhance chemical analysis or morphological characteristics. Useful for elemental chemical analysis from Na to U, study of surface morphologies, particle size measurement and microstructural features.